Description

Powerful Hardware
Achieving the energy-efficient and compact optical design, the MESA-50 features a high-performance Silicon Drift Detector (SDD) for more excellent sensitivity and performance comparable to conventional benchtop EDXRF analyzers. It works without the need of vacuum pump and reduces running costs.
Powerful X-ray generator: Up to 50 kV, 200 μA, 10 W with Pd target
Multiple Primary X-ray filters: Enhance S/N by cutting off background
Switchable multi-collimators: Selectable down to 1.2 mm up to 7 mm
Silicon drift detector: Achieve high performance without liquid nitrogen
 
 
MESA-50 hardware (left) and the optic design diagram (right)
 

Simple Operation
Set the sample on the measurement window of MESA-50
Press “Measurement Start” button in the software
While the measurement, the red X-RAY ON lamp turns on
The measurement results are shown in the software
Report function: The result can be output in Microsoft Excel(R), Word(R) or PDF formats
We have a variety of sample cells available to choose from for your liquid samples. Please refer how to choose and assemble the sample cells for your reference.

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Optional Software Modules
RoHS module
The RoHS module allows user to perform RoHS screening analysis and halogen screening analysis by just one click a button. The module offers built in workflow which enables automatic sequential measurement without special skill and knowledge of user.
As/Sb module
The As/Sb module is an additional module to the RoHS module. The module can determine As and Sb concentration using the built in parameters. The module can export a report which include the result of As and Sb.
Multilayer FPM module
The multilayer FPM module is an optional software for thickness calculation. The software calculates the layer thickness of a multilayer sample using user defined layer modeling. It allows users to get layer thickness result even without standard samples.
     *MESA-50 software can calculate thickness without the optional software module if it is based on calibration curve method.